To Draw the I-V Characteristic Curve for a P-N Junction Diode in Forward and Reverse Bias
1. Aim
To draw the current-voltage (I-V) characteristic curve for a p-n junction diode in both forward and reverse bias conditions, and to analyze the behavior of the diode under different voltage conditions.
2. Apparatus Used
- Silicon or Germanium p-n junction diode (1N4007 or suitable equivalent)
- DC power supply (0-30V)
- Digital multimeter or ammeter (0-100mA range)
- Digital voltmeter (0-30V range)
- Rheostat/Potentiometer (1kΩ, 2W)
- Resistor (1kΩ, 0.5W) for current limiting
- SPDT switch
- Breadboard and connecting wires
- Graph paper for plotting results
3. Diagram
Fig 1: Circuit diagram for measuring I-V characteristics of a p-n junction diode
4. Theory
A p-n junction diode is a semiconductor device formed by joining p-type (excess holes) and n-type (excess electrons) semiconductor materials. The junction between these two regions creates a depletion region that acts as a barrier to the movement of charge carriers.
Forward Bias: When a positive voltage is applied to the p-side and negative to the n-side, the depletion region narrows. When the applied voltage overcomes the barrier potential (0.7V for silicon, 0.3V for germanium), a large current begins to flow through the diode.
Reverse Bias: When a negative voltage is applied to the p-side and positive to the n-side, the depletion region widens. Only a very small leakage current flows through the diode until the breakdown voltage is reached.
The I-V characteristic curve of a p-n junction diode is non-linear. The current through the diode varies exponentially with the applied voltage as given by the Shockley diode equation:
Where:
- $I$ is the diode current
- $I_s$ is the reverse saturation current
- $V$ is the voltage across the diode
- $q$ is the elementary charge ($1.602 \times 10^{-19}$ coulombs)
- $k$ is the Boltzmann constant ($1.381 \times 10^{-23}$ J/K)
- $T$ is the absolute temperature in Kelvin
- $n$ is the ideality factor (typically between 1 and 2)
5. Formula
Shockley Diode Equation:
$$I = I_s \left( e^{\frac{qV}{nkT}} - 1 \right)$$For Forward Bias (V >> kT/q):
$$I \approx I_s e^{\frac{qV}{nkT}}$$Taking logarithm:
$$\ln(I) = \ln(I_s) + \frac{qV}{nkT}$$For Silicon Diode at room temperature (T = 300K), the equation simplifies to:
$$I \approx I_s e^{\frac{V}{n \times 0.026}}$$For Reverse Bias (V << -kT/q):
$$I \approx -I_s$$6. Procedure
A. Forward Bias Characteristics
- Set up the circuit as shown in the diagram with the switch in the forward bias position (p-side connected to the positive terminal of the power supply).
- Ensure the power supply is set to zero voltage initially.
- Gradually increase the voltage using the rheostat in small steps (0.1V increments up to 1V, then 0.2V increments thereafter).
- For each voltage setting, record the corresponding current reading from the ammeter.
- Continue until you have a sufficient number of readings (at least 10-15 data points).
- Turn off the power supply when done with forward bias measurements.
B. Reverse Bias Characteristics
- Switch the SPDT switch to the reverse bias position (p-side connected to the negative terminal of the power supply).
- Starting from zero, gradually increase the reverse voltage in steps of 1V.
- Record the corresponding reverse current for each voltage setting.
- Be careful not to exceed the reverse breakdown voltage of the diode.
- Take at least 10 readings in the reverse bias region.
- Turn off the power supply and disconnect the circuit when done.
7. Observation Table
Table 1: Forward Bias Readings
S.No. | Forward Voltage (V) in Volts | Forward Current (I) in mA |
---|---|---|
1 | 0.0 | 0.0 |
2 | 0.1 | 0.01 |
3 | 0.2 | 0.02 |
4 | 0.3 | 0.04 |
5 | 0.4 | 0.08 |
6 | 0.5 | 0.15 |
7 | 0.6 | 0.36 |
8 | 0.7 | 2.1 |
9 | 0.8 | 10.5 |
10 | 0.9 | 27.8 |
11 | 1.0 | 45.2 |
Table 2: Reverse Bias Readings
S.No. | Reverse Voltage (V) in Volts | Reverse Current (I) in μA |
---|---|---|
1 | 0.0 | 0.0 |
2 | 1.0 | 0.2 |
3 | 2.0 | 0.2 |
4 | 3.0 | 0.3 |
5 | 4.0 | 0.3 |
6 | 5.0 | 0.4 |
7 | 10.0 | 0.5 |
8 | 15.0 | 0.6 |
9 | 20.0 | 0.7 |
8. Calculations
From the observed data, we can calculate various diode parameters:
1. Static Resistance
The static resistance at a particular operating point (V, I) is given by:
For example, at V = 0.7V and I = 2.1mA:
2. Dynamic Resistance
The dynamic or AC resistance is given by:
For example, between V = 0.7V and V = 0.8V:
3. Ideality Factor
The ideality factor can be calculated from the slope of the ln(I) vs V plot:
At room temperature (T = 300K):
4. Knee Voltage
From the forward bias characteristic curve, the knee voltage (where current starts to increase rapidly) is approximately 0.7V for a silicon diode.
9. Result
Based on the observations and calculations, we can draw the following conclusions:
- The p-n junction diode exhibits nonlinear I-V characteristics.
- In forward bias:
- The diode conducts significantly after overcoming the barrier potential (approximately 0.7V for silicon).
- The current increases exponentially with voltage as predicted by the Shockley equation.
- The static resistance decreases as the voltage increases.
- In reverse bias:
- The diode conducts very little current (in μA range).
- The reverse current is almost constant and independent of the applied reverse voltage (until breakdown).
- The calculated ideality factor of the diode is approximately _____ (to be filled after calculation).
- The knee voltage (barrier potential) of the diode is approximately 0.7V, confirming it is a silicon diode.
Fig 2: I-V Characteristic Curve of P-N Junction Diode showing forward and reverse bias regions
10. Precautions
- Always connect the diode in the correct polarity as per the circuit diagram.
- Use a current limiting resistor to prevent damage to the diode from excessive current.
- Start with zero voltage and increase gradually to avoid sudden surges.
- In forward bias, do not exceed the maximum current rating of the diode.
- In reverse bias, do not exceed the breakdown voltage of the diode.
- Ensure proper connections and tight junctions to minimize contact resistance.
- Use calibrated measuring instruments for accurate readings.
- Allow the circuit to stabilize before taking readings.
- Avoid heating the diode by limiting the time it conducts high current.
- Handle the semiconductor diode carefully to prevent static discharge damage.
- Maintain room temperature during the experiment for consistent results.
11. Sources of Error
- Instrument Errors: Limited precision and accuracy of the voltmeter and ammeter used.
- Temperature Variations: Changes in ambient temperature can affect the diode characteristics.
- Contact Resistance: Poor connections can introduce additional resistance in the circuit.
- Voltage Drop in Ammeter: The internal resistance of the ammeter can affect the voltage across the diode.
- Component Tolerance: Variation in the actual values of resistors from their nominal values.
- Diode Heating: Self-heating of the diode during measurement can alter its characteristics.
- Reading Errors: Parallax errors when reading analog meters.
- Stray Capacitance and Inductance: Can affect measurements, especially at high frequencies.
- Power Supply Fluctuations: Variations in input voltage can affect the measurements.