HALL EFFECT EXPERIMENT
1. AIM
To determine the Hall coefficient and mobility of charge carriers in a semiconductor sample using the Hall Effect.
2. APPARATUS REQUIRED
- Semiconductor sample (n-type or p-type)
- Electromagnet with adjustable pole pieces
- Hall effect probe with sample holder
- DC power supply (0-30V)
- Current source (0-100mA)
- Digital gauss meter
- Digital multimeter or nanovoltmeter
- Micrometer or vernier caliper
- Connecting wires and cables
- Thermometer
3. DIAGRAM
Figure 1: Schematic diagram of the Hall effect experimental setup showing the semiconductor sample placed perpendicular to the magnetic field with current and voltage connections.
4. THEORY
The Hall effect is a fundamental phenomenon in solid-state physics that occurs when a conductor or semiconductor carrying an electric current is placed in a magnetic field perpendicular to the current direction. This causes charge carriers to experience a Lorentz force perpendicular to both the magnetic field and the current flow, resulting in an accumulation of charges on the sides of the sample.
When a current flows through a semiconductor placed in a magnetic field, charge carriers (electrons or holes) are deflected due to the magnetic force. This deflection creates an electric field perpendicular to both the current and magnetic field, leading to a potential difference across the sample known as the Hall voltage.
Consider a rectangular semiconductor sample with thickness $t$, width $w$, and length $l$. When a current $I$ flows along the length and a magnetic field $B$ is applied perpendicular to the sample, the charge carriers experience a Lorentz force:
Where $q$ is the charge of the carrier and $v$ is the drift velocity. This force deflects carriers toward one side of the sample, creating an electric field $E_H$ (Hall field) that counterbalances the Lorentz force. At equilibrium:
This produces a Hall voltage $V_H$ across the width $w$ of the sample:
The drift velocity $v$ is related to the current density $J$ by:
Where $n$ is the carrier concentration. The current $I$ through the sample is:
The Hall coefficient $R_H$ is defined as:
For a semiconductor with a single type of charge carrier, the Hall coefficient is related to the carrier concentration by:
The sign of $R_H$ indicates the type of semiconductor:
- Negative $R_H$ indicates an n-type semiconductor (electrons are majority carriers)
- Positive $R_H$ indicates a p-type semiconductor (holes are majority carriers)
The carrier mobility $\mu$ can be calculated from the Hall coefficient and the conductivity $\sigma$ of the sample:
where the conductivity is determined from:
Here, $R$ is the resistance of the sample, $V$ is the voltage drop along the length when current $I$ flows, and $l$, $w$, and $t$ are the length, width, and thickness of the sample, respectively.
5. FORMULAS
- Hall voltage:
$V_H = \frac{I \cdot B}{n \cdot q \cdot t}$
- Hall coefficient:
$R_H = \frac{V_H \cdot t}{I \cdot B} = \frac{1}{n \cdot q}$
- Carrier concentration:
$n = \frac{1}{|R_H| \cdot q}$where $q = 1.602 \times 10^{-19}$ C for electrons and holes.
- Conductivity:
$\sigma = \frac{I \cdot l}{V \cdot w \cdot t}$
- Resistivity:
$\rho = \frac{1}{\sigma}$
- Carrier mobility:
$\mu = |R_H| \cdot \sigma$
6. PROCEDURE
- Sample Preparation and Mounting:
- Measure the dimensions (length, width, and thickness) of the semiconductor sample using a micrometer or vernier caliper.
- Clean the sample with isopropyl alcohol to remove any contamination.
- Mount the sample on the Hall probe holder, ensuring proper electrical contacts.
- Initial Setup:
- Connect the current source to the ends of the sample to provide current along the length.
- Connect the voltmeter to the sides of the sample to measure the Hall voltage.
- Place the sample between the electromagnet poles such that the magnetic field is perpendicular to the sample surface.
- Zero Field Measurements:
- Set the magnetic field to zero.
- Apply a fixed current through the sample (e.g., 10 mA).
- Measure and record any offset voltage across the Hall probes (this should ideally be zero but may have a small value due to contact misalignment).
- Measure the voltage drop along the length of the sample to calculate its resistance and conductivity.
- Hall Voltage Measurements:
- Turn on the electromagnet and set it to a known magnetic field strength (measure using the gauss meter).
- Maintain the same current through the sample.
- Measure the Hall voltage across the sides of the sample.
- Repeat the measurement for different values of the magnetic field (e.g., from 0.1 T to 0.5 T in steps of 0.1 T).
- Current Dependence:
- Set the magnetic field to a fixed value (e.g., 0.3 T).
- Vary the current through the sample (e.g., from 5 mA to 50 mA in suitable steps).
- Measure the Hall voltage for each current value.
- Polarity Check:
- Reverse the direction of the magnetic field and repeat the Hall voltage measurement.
- The Hall voltage should change its sign.
- Similarly, reverse the current direction and observe the Hall voltage.
- Temperature Dependence (Optional):
- If available, use a temperature-controlled setup to measure the Hall coefficient at different temperatures.
- Record the sample temperature and corresponding Hall voltage.
7. OBSERVATION TABLES
Sample Details:
Sample Material | ___________ |
Sample Type (n-type/p-type) | ___________ |
Length (l) | ___________ mm |
Width (w) | ___________ mm |
Thickness (t) | ___________ mm |
Temperature | ___________ K |
Table 1: Hall Voltage vs. Magnetic Field (at constant current I = _____ mA)
S.No. | Magnetic Field B (Tesla) | Hall Voltage $V_H$ (mV) | Hall Coefficient $R_H = \frac{V_H \cdot t}{I \cdot B}$ (m³/C) |
---|---|---|---|
1 | |||
2 | |||
3 | |||
4 | |||
5 | |||
Average Hall Coefficient ($R_H$) |
Table 2: Hall Voltage vs. Current (at constant magnetic field B = _____ T)
S.No. | Current I (mA) | Hall Voltage $V_H$ (mV) | Hall Coefficient $R_H = \frac{V_H \cdot t}{I \cdot B}$ (m³/C) |
---|---|---|---|
1 | |||
2 | |||
3 | |||
4 | |||
5 | |||
Average Hall Coefficient ($R_H$) |
Table 3: Resistivity and Mobility Calculation
Parameter | Value | Unit |
---|---|---|
Current (I) | mA | |
Voltage along length (V) | V | |
Resistance (R = V/I) | Ω | |
Conductivity (σ) | (Ω·m)⁻¹ | |
Hall Coefficient (RH) | m³/C | |
Mobility (μ = |RH|·σ) | m²/(V·s) | |
Carrier Concentration (n) | m⁻³ |
8. CALCULATIONS
Step 1: Calculate the Hall coefficient $R_H$ for each observation using:
Where:
- $V_H$ is the measured Hall voltage in volts
- $t$ is the thickness of the sample in meters
- $I$ is the current flowing through the sample in amperes
- $B$ is the magnetic field strength in tesla
Step 2: Calculate the average value of the Hall coefficient from all observations.
Step 3: Determine the type of semiconductor based on the sign of $R_H$:
- If $R_H$ is negative, the sample is n-type (electrons are majority carriers)
- If $R_H$ is positive, the sample is p-type (holes are majority carriers)
Step 4: Calculate the carrier concentration using:
Where $e = 1.602 \times 10^{-19}$ C is the elementary charge.
Step 5: Calculate the conductivity of the sample:
Where:
- $I$ is the current flowing through the sample
- $l$ is the length of the sample
- $V$ is the voltage drop along the length
- $w$ is the width of the sample
- $t$ is the thickness of the sample
Step 6: Calculate the mobility of charge carriers:
Sample Calculation:
Given:
- Sample thickness, $t = 0.5$ mm = $5 \times 10^{-4}$ m
- Current, $I = 10$ mA = $1 \times 10^{-2}$ A
- Magnetic field, $B = 0.3$ T
- Measured Hall voltage, $V_H = -2.5$ mV = $-2.5 \times 10^{-3}$ V
- Sample length, $l = 10$ mm = $1 \times 10^{-2}$ m
- Sample width, $w = 3$ mm = $3 \times 10^{-3}$ m
- Voltage along length, $V = 0.2$ V
Hall coefficient:
Carrier concentration:
Conductivity:
Mobility:
9. RESULT
- The Hall coefficient of the given semiconductor sample is ______ m³/C.
- The sample is determined to be ______ type semiconductor (n-type/p-type).
- The carrier concentration is ______ m⁻³.
- The conductivity of the sample is ______ (Ω·m)⁻¹.
- The mobility of charge carriers in the sample is ______ m²/(V·s).
These results align with the typical values for semiconductor materials, confirming the validity of the Hall effect as a method for determining carrier properties in semiconductors.
10. PRECAUTIONS
- Ensure that the sample is clean and free from contamination before mounting.
- Make good electrical contacts to minimize contact resistance.
- Place the sample exactly perpendicular to the magnetic field for accurate measurements.
- Verify that the Hall probes are placed directly opposite to each other on the sample to measure the true Hall voltage.
- Maintain a constant temperature throughout the experiment, as carrier concentration and mobility are temperature-dependent.
- Use a high-precision voltmeter (preferably a nanovoltmeter) to measure the Hall voltage accurately, as it can be quite small.
- Take measurements for both field polarities and average the results to eliminate thermoelectric and other spurious effects.
- Ensure that the sample thickness is uniform throughout.
- Keep the current density uniform by using a sample with uniform cross-section.
- Avoid sample heating by keeping the current at a reasonable level.
- Shield the setup from external electromagnetic interference.
- Allow sufficient time for the magnetic field to stabilize before taking readings.
- Ensure that all measuring instruments are properly calibrated.